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Cryogenic preamplification of a single-electron-transistor using a silicon-germanium heterojunction-bipolar-transistor

机译:使用a的单电子晶体管的低温预放大   硅锗异质结双极晶体管

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摘要

We examine a silicon-germanium heterojunction bipolar transistor (HBT) forcryogenic pre-amplification of a single electron transistor (SET). The SETcurrent modulates the base current of the HBT directly. The HBT-SET circuit isimmersed in liquid helium, and its frequency response from low frequency toseveral MHz is measured. The current gain and the noise spectrum with the HBTresult in a signal-to-noise-ratio (SNR) that is a factor of 10-100 larger thanwithout the HBT at lower frequencies. The transition frequency defined by SNR =1 has been extended by as much as a factor of 10 compared to without the HBTamplification. The power dissipated by the HBT cryogenic pre-amplifier isapproximately 5 nW to 5 {\mu}W for the investigated range of operation. Thecircuit is also operated in a single electron charge read-out configuration inthe time-domain as a proof-of-principle demonstration of the amplificationapproach for single spin read-out.
机译:我们研究了硅锗异质结双极晶体管(HBT)的单电子晶体管(SET)的低温预放大。 SETcurrent直接调制HBT的基极电流。将HBT-SET电路浸入液氦中,并测量其从低频到几MHz的频率响应。具有HBT的电流增益和噪声频谱导致信噪比(SNR)比在较低频率下没有HBT时高10-100倍。与没有HBTamplification相比,由SNR = 1定义的过渡频率已扩展了多达10倍。对于所研究的操作范围,HBT低温前置放大器所耗散的功率约为5 nW至5 {W。该电路还在时域中以单电子电荷读出配置进行操作,作为原理证明了单自旋读出的放大方法。

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